This converter changes the ASCII file (.LIS), which was stored originally as RD binary file and typed out as an ASCII data, to the another format of ASCII Data-File (.IN3 file) on MS-DOS.
HINT: After your X-ray diffraction measurement, return to the main menu and enter LIST. Select DATA file and let it save as the ASCII file with the FULL_HEADER. The OPTION/DEFAULT function of Philips menu may help you. Somehow, you should export this ASCII file to the MS-DOS file. My terminal emulator APD10 may help it for the Japanese users. Connect your NEC-PC to RS282C of DEC-PDP11.
HINT 2: If you will set PIF file in WINDOWS3.1 or Short-CUT in WINDOWS95, please set its work directory on your data file directory. It omits some lazy key strokes...
RAW DATA FILE 17-JUL-95 20:39 ------------------------------------------------------------------------ PW1700 Automated Powder Diffractometer System 1 Listed RD file name : K2SIDE.RD Sample identification : deura-K2-TiCl4+Mg-si Measurement date/time : 27-APR-95 11:20 Diffractometer system : 1 Generator settings : 40 kV, 40 mA Cu alpha1,2 wavelengths : 1.54060, 1.54439 Ang Step size, sample time : 0.025 deg, 0.50 s, 0.050 deg/s Monochromator used : Yes Divergence slit : Automatic (Irradiated sample length: 12.5 mm) Analysis program number : 49 File angle range : 15.000 - 90.000 deg Range in D spacing : 1.08937 - 5.9015 Ang Maximum intensity : 524. cts, 1048.8 cps Angle Counts ------------------------------------------------------------------------ 15.0000 42. 52. 38. 40. 42. 15.1250 52. 48. 38. 49. 52. 15.2500 50. 38. 44. 40. 48. 15.3750 45. 45. 37. 45. 53. 15.5000 53. 48. 42. 55. 50. 15.6250 64. 48. 50. 46. 38. 15.7500 66. 62. 48. 53. 56.....Skip about a few tens lines.... 19.7500 130. 117. 112. 108. 86. 19.8750 106. 108. 108. 112. 112. 20.0000 110.
* RAW DATA FILE 17-JUL-95 20:39 * ------------------------------------------------------------------------ * * PW1700 Automated Powder Diffractometer System 1 * * Listed RD file name : K2SIDE.RD * Sample identification : deura-K2-TiCl4+Mg-si * Measurement date/time : 27-APR-95 11:20 * Diffractometer system : 1 * Generator settings : 40 kV, 40 mA * Cu alpha1,2 wavelengths : 1.54060, 1.54439 Ang * Step size, sample time : 0.025 deg, 0.50 s, 0.050 deg/s * Monochromator used : Yes * Divergence slit : Automatic (Irradiated sample length: 12.5 mm) * * Analysis program number : 49 * File angle range : 15.000 - 90.000 deg * Range in D spacing : 1.08937 - 5.9015 Ang * Maximum intensity : 524. cts, 1048.8 cps * * Angle Counts * ------------------------------------------------------------------------ 201 15 .025 15.000 42 15.025 52 15.050 38 15.075 40 15.100 42 15.125 52....Skip about 200 lines.... 19.875 106 19.900 108 19.925 108 19.950 112 19.975 112 20.000 110
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